Rule mining and classification in the presence of feature level and class label ambiguities

Rule mining and classification in the presence of feature level and class label ambiguities

著者名:

Hewawasam, K. K. R. G. K. ( Univ. of Miami (USA) )
Premaratne, K. ( Univ. of Miami (USA) )
Shyu, M. -L. ( Univ. of Miami (USA) )
Subasingha, S. P. ( Univ. of Miami (USA) )

掲載資料名:

Intelligent Computing: Theory and Applications III

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5803

発行年:

2005

開始ページ:

98

終了ページ:

107

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0227786X

ISBN:

9780819457882 [0819457884]

言語:

英語

請求記号:

P63600/5803

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015035
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Intelligent computing : theory and applications
回次:	2005 : 3rd
会議開催地:	Orlando, FL, USA
会議開催年:	2005.03.28-2005.03.29

類似資料:

1 国際会議録 Learning Bayesian network parameters from imperfect data: enhancements to the EM algorithm R. Hewawasam, K. Premaratne SPIE - The International Society of Optical Engineering	7 国際会議録 Feature level test patterns for characterizing residual process effects Neureuther, A.R., McIntyre, G.R., Gennari, F.E., Lam, M., Cain, J.P., Robins, G.C., Huang, E., Choi, J., Wang, L., Yuan, … SPIE - The International Society of Optical Engineering
2 国際会議録 Utilizing a class labeling feature in an adaptive Bayesian classifier Lynch Jr.,R.S., Willett,P.K. SPIE-The International Society for Optical Engineering	8 国際会議録 Single-input/multi-output strategies for floor vibration control Hanagan,L.M., Premaratne,K. SPIE - The International Society for Optical Engineering
3 国際会議録 Automated simultaneous multiple feature classification of MTI data Harvey, N.R., Theiler, J.P., Balick, L.K., Pope, P.A., Szymanski, J.J., Perkins, S.J., Porter, R.B., Brumby, S.P., … SPIE-The International Society for Optical Engineering	9 国際会議録 Class-specific feature selection based on uniform dirichlet priors Lynch,R.S.,Jr., Willett,P.K. SPIE - The International Society for Optical Engineering
4 国際会議録 Mining association rules between low-level image features and high-level concepts Sethi,I.K., Coman,I.L., Stan,D. SPIE-The International Society for Optical Engineering	10 国際会議録 Explorer-class astrobiology mission Sandford,S., Greene,T.P., Allamandola,L., Arno,R., Bregman,J.D., Cox,S., Davis,P.K., Gonzalez,A., Haas,M.R., Hanel,R.P., … SPIE - The International Society for Optical Engineering
5 国際会議録 Experimental demonstration of impact of amplified spontaneous emission on devices based on cross-gain modulation in semiconductor optical amplifiers B. S. G. Pillai, K. L. Lee, A. Nirmalathas, M. Premaratne, C. Lim SPIE - The International Society of Optical Engineering	11 国際会議録 Subresolution assist feature implementation for high-performance logic gate-level lithography Gabor, A.H., Bruce, J., Chu, W., Ferguson, R., Fonseca, C.A., Gordon, R.L., Jantzen, K., Khare, M., Lavin, M., Lee, … SPIE-The International Society for Optical Engineering
6 国際会議録 Scene classification using low-level feature and intermediate feature P. Zeng, J. Wen, L.-D. Wu Society of Photo-optical Instrumentation Engineers	12 国際会議録 Phase ambiguity solution with the Pyramid Phasing Sensor [6267-83] Pinna E., Esposito S., Puglisi A., Pieralli F., Myers R. M., Busoni L., Tozzi A., Stefanini P. SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12