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Data modeling enabled real-time image processing for target discrimination

著者名:
Jaenisch, H. M. ( dtech Systems, Inc. (USA) and James Cook Univ. (Australia) )
Handley, J. W. ( James Cook Univ. (Australia) and Sparta, Inc. (USA) )
Carroll, M. P. ( Tec-Masters, Inc. (USA) )
Faucheux, J. P. ( Sparta, Inc. (USA) )
Thurk, M. ( Matrix Advanced Solutions Germany GmbH (Germany) )
Goetz, R. ( Matrix Advanced Solutions Germany GmbH (Germany) )
Egorov, M. ( Matrix Advanced Solutions Germany GmbH (Germany) )
Wiesenfeldt, M. ( Matrix Advanced Solutions Germany GmbH (Germany) )
さらに 3 件
掲載資料名:
Infrared imaging systems : design, analysis, modeling, and testing XVI : 30 March-1 April 2005, Orlando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5784
発行年:
2005
開始ページ:
178
終了ページ:
189
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457691 [0819457698]
言語:
英語
請求記号:
P63600/5784
資料種別:
国際会議録

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