Identification in static luminance and color noise

Identification in static luminance and color noise

著者名:

Bijl, P. ( TNO Human Factors (Netherlands) )
Lucassen, M. P. ( TNO Human Factors (Netherlands) )
Roelofsen, J. ( TNO Human Factors (Netherlands) )

掲載資料名:

Infrared imaging systems : design, analysis, modeling, and testing XVI : 30 March-1 April 2005, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5784

発行年:

2005

開始ページ:

35

終了ページ:

41

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457691 [0819457698]

言語:

英語

請求記号:

P63600/5784

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015015
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Infrared Imaging Systems
回次:	2005 : 16th
会議開催地:	Orlando, FL, USA
会議開催年:	2005.03.30-2005.04.01

類似資料:

1 国際会議録 Identification of military targets and simple laboratory test patterns in band-limited noise Bijl, P., Hogervorst, M.A., Toet, A. SPIE - The International Society of Optical Engineering	7 国際会議録 Color Blouin, F. A., Zarins, Z. M., Cherry, J. P. American Chemical Society
2 国際会議録 A universal color image quality metric Toet, A., Lucassen, M.P. SPIE-The International Society for Optical Engineering	8 国際会議録 TOD:a new method to characterize electro-optical system performance Bijl,P., Valeton,J.M. SPIE-The International Society for Optical Engineering
3 国際会議録 Testing the Contrast Explanation of color constancy Walraven J., Benzschawel L. T., Rogowitz E. B., Lucassen P. M. Plenum Press	9 国際会議録 Test of three visual search and detection models Toet,A., Bijl,P., Valeton,J.M. SPIE - The International Society for Optical Engineering
4 国際会議録 Luminance contrast and color recognition in helmet-mounted displays Havig,P.R., Grigsby,S.S., Heft,E.L., LaCreta,J.M., Post,D.L. SPIE-The International Society for Optical Engineering	10 国際会議録 Guidelines for accurate TOD measurement Bijl,P., Valeton,J.M. SPIE - The International Society for Optical Engineering
5 国際会議録 Measurement of luminance noise and chromaticity noise of LCDs with a colorimeter and a color camera H. Roehrig, W. J. Dallas, E. A. Krupinski, G. R. Redford Society of Photo-optical Instrumentation Engineers	11 国際会議録 NVThermIP vs TOD: matching the target acquisition range criteria P. Bijl, M. A. Hogervorst SPIE - The International Society of Optical Engineering
6 国際会議録 Identifiability: a fast way to measure identification performance Hogervorst, M.A., Toet, A., Bijl, P., Miller, B. SPIE - The International Society of Optical Engineering	12 国際会議録 Effects of band-limited noise on human observer performance S. Salem, E. Jacobs, R. Moore, M. Hogervorst, P. Bijl, C. Halford SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12