Inverse scattering approach to improving pattern recognition

Inverse scattering approach to improving pattern recognition

著者名:

Chapline, G. ( Lawrence Livermore National Lab. (USA) )
Fu, C.-Y. ( Lawrence Livermore National Lab. (USA) )

掲載資料名:

Optics and photonics in global homeland security : 29 March-1 April, 2005, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5781

発行年:

2005

開始ページ:

120

終了ページ:

126

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457660 [0819457663]

言語:

英語

請求記号:

P63600/5781

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015011
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Optics and Photonics in Global Homeland Security
回次:	2005
会議開催地:	Orlando, FL, USA
会議開催年:	2005.03.29-2005.04.01

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