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Characterization of ZnO films grown on different substrates by L-MBE method

著者名:
Yang, X. ( Xi'an Jiaotong Univ. (China), Xi'an Institute of Optics and Precision Mechanics, CAS (China), and Graduate School of the Chinese Academy of Sciences (China) )
Zhang, J. ( Xi'an Jiaotong Univ. (China) and Xi'an Institute of Optics and Precision Mechanics. CAS (China) )
Xu, Q. ( Xi'an Jiaotong Univ. (China), Xi'an Institute of Optics and Precision Mechanics. CAS (China), and Graduate School of the Chinese Academy of Sciences (China) )
He, Y. ( Xi'an Jiaotong Univ. (China) )
Wang, H. ( Xi'an Jiaotong Univ. (China) )
Zhang, W. ( Henan Univ. (China) )
Hou, X. ( Xi'an Jiaotong Univ. (China), Xi'an Institute of Optics and Precision Mechanics. CAS (China), Graduate School of the Chinese Academy of Sciences (China), and Henan Univ. (China) )
さらに 2 件
掲載資料名:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5774
発行年:
2004
開始ページ:
369
終了ページ:
372
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457554 [0819457558]
言語:
英語
請求記号:
P63600/5774
資料種別:
国際会議録

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