An initial investigation of the large strain and fatigue loading behavior of piezoelectric wafer active sensors

An initial investigation of the large strain and fatigue loading behavior of piezoelectric wafer active sensors

著者名:

Doane, J. ( Univ. of South Carolina(USA) )
Giurgiutiu, V. ( Univ. of South Carolina(USA) )

掲載資料名:

Smart structures and materials 2005 : Sensors and smart structures technologies for civil, mechanical, and aerospace systems : 7-10 March 2005, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5765

発行年:

2005

開始ページ:

1148

終了ページ:

1160

総ページ数:

13

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457462 [0819457469]

言語:

英語

請求記号:

P63600/5765-2

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014993
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	2005
会議開催地:	San Diego, CA, USA
会議開催年:	2005.03.07-2005.03.10

類似資料:

1 国際会議録 Lamb wave generation with piezoelectric wafer active sensors for structural health monitoring Giurgiutiu, V. SPIE-The International Society for Optical Engineering	7 国際会議録 Simulation of the Lamb wave interaction between piezoelectric wafer active sensors and host structure Bottai, G., Giurgiutiu, V. SPIE - The International Society of Optical Engineering
2 国際会議録 Disbond detection in adhesively bonded structures using piezoelectric wafer active sensors Cuc, A., Giurgiutiu, V. SPIE - The International Society of Optical Engineering	8 国際会議録 Review of in situ fabrication methods of piezoelectric wafer active sensor for sensing and actuation applications Lin, B., Giurgiutiu, V. SPIE - The International Society of Optical Engineering
3 テクニカルペーパー New Results in the Use of Piezoelectric Wafer Active Sensors for Structural Health Monitoring Giurgiutiu, V. American Institute of Aeronautics and Astronautics	9 国際会議録 Finite element simulation of piezoelectric wafer active sensors for structural health monitoring with coupled-filed elements W. Liu, V. Giurgiutiu SPIE - The International Society of Optical Engineering
4 国際会議録 Corrosion damage detection with piezoelectric wafer active sensors Thomas, D.T., Welter, J.T., Giurgiutiu, V. SPIE - The International Society of Optical Engineering	10 国際会議録 On the modeling of piezoelectric wafer active sensor impedance analysis for structural health monitoring [6174-08] Lin, B., Giurgiutiu, V. SPIE - The International Society of Optical Engineering
5 テクニカルペーパー Embedded Ultrasonics with Piezoelectric Wafer Active Sensors for Structural Health Monitoring of Thin-Wall Structures. Giurgiutiu, V. American Society of Mechanical Engineers	11 国際会議録 Finite element modeling and simulation of piezoelectric wafer active sensors interaction with the host structure for structural health monitoring [6174-107] Liu, W., Giurgiutiu, V. SPIE - The International Society of Optical Engineering
6 国際会議録 Signal processing techniques for damage detection with piezoelectric wafer active sensors and embedded ultrasonic structural radar Yu, L., Bao, J., Giurgiutiu, V. SPIE - The International Society of Optical Engineering	12 国際会議録 Development of specifications for an integrated piezoelectric wafer active sensors system Jenkins, C., Giurgiutiu, V., Lin, B., Liu, W. SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12