Blank Cover Image

Comparison of decision tree classifiers with neural network and linear discriminant analysis classifiers for computer-aided diagnosis: a Monte Carlo simulation study

著者名:
掲載資料名:
Medical Imaging 2005: Image Processing
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5747
発行年:
2005
開始ページ:
258
終了ページ:
265
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819457219 [0819457213]
言語:
英語
請求記号:
P63600/5747-1
資料種別:
国際会議録

類似資料:

Chan, H.-P., Sahiner, B., Hadjiiski, L.M., Petrick, N., Zhou, C.

SPIE-The International Society for Optical Engineering

Hadjiiski, L., Drouillard, D., Chan, H.-P., Sahiner, B., Helvie, M. A., Roubidoux, M., Zhou, C

SPIE - The International Society of Optical Engineering

Sahiner,B., Chan,H.-P., Petrick,N., Wagner,R.F., Hadjiiski,L.M.

SPIE - The International Society for Optical Engineering

Gurcan, M.N., Chan, H.-P., Sahiner, B., Hadjiiski, L.M., Petrick, N., Helvie, M.A.

SPIE-The International Society for Optical Engineering

Ge, J., Wei, J., Hadjiiski, L. M., Sahiner, B., Chan, H.-P., Helvie, M. A., Zhou, C.

SPIE - The International Society of Optical Engineering

Wei, J., Sahiner, B., Hadjiiski, L. M, Chan H. P, Helvie, M. A, Roubidoux, M. A, Zhou, C, Ge, J, Zhang, Y

SPIE - The International Society of Optical Engineering

L. Hadjiiski, T. W. Way, B. Sahiner, H. Chan, P. Cascade, N. Bogot, E. Kazerooni, C. Zhou

SPIE - The International Society of Optical Engineering

Wei, J., Sahiner, B., Hadjiiski, L. M., Chan, H.-P., Helvie, M. A., Roubidoux, M. A., Petrick, N., Ge, J., Zhou, C.

SPIE - The International Society of Optical Engineering

Wu, Y.-T., Hadjiiski, L. M., Wei, J., Zhou, C, Sahiner, B, Chan, H.-P.

SPIE - The International Society of Optical Engineering

J. Wei, B. Sahiner, H. Chan, L. M. Hadjiiski, M. A. Roubidoux, M. A. Helvie, J. Ge, C. Zhou, Y. Wu

SPIE - The International Society of Optical Engineering

Wei, J., Sahiner, B., Hadjiiski, L.M., Chan, H.-P., Petrick, N., Helvie, M.A., Zhou, C., Ge, Z.

SPIE - The International Society of Optical Engineering

Ge, J., Sahiner, B., Chan, H.-P., Hadjiiski, L. M., Helvie, M. A., Zhou, C., Wei, J., Zhang, Y.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12