X-ray dark-field imaging and potential of its clinical application
- 著者名:
Shimao, D. ( Graduate Univ. of Advanced Studies (Japan) ) Sugiyama, H. ( Graduate Univ. of Advanced Studies (Japan) and Photon Factory, KEK (Japan) ) Kunisada, T. ( Okayama Univ. (Japan) ) Maksimenko, A. ( Photon Factory, KEK (Japan) ) Toyofuku, F. ( Kyushu Univ. (Japan) ) Ueno, E. ( Univ. of Tsukuba (Japan) ) Yamasaki, K. ( Spring-8, JASRI (Japan) and Kobe Univ. (Japan) ) Obayashi, C. ( Kobe Univ. (Japan) ) Hyodo, K. ( Photon Factory, KEK (Japan) ) Li, G. ( Beijing Synchrotron Radiation Facility, IHEP (China) ) Pan, L. ( China-Japan Friendship Hospital (China) ) Jiang, X. ( Beijing Synchrotron Radiation Facility, IHEP (China) ) Ando, M. ( Graduate Univ. of Advanced Studies (Japan) and Photon Factory, KEK (Japan) ) - 掲載資料名:
- Medical Imaging 2005: Physics of Medical Imaging
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5745
- 発行年:
- 2005
- 開始ページ:
- 32
- 終了ページ:
- 39
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819457196 [0819457191]
- 言語:
- 英語
- 請求記号:
- P63600/5745-1
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Application of x-ray computed tomography based on the refraction contrast to biomedicine [6142-39]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
8
国際会議録
Improving the contrast resolution of DEI image using the resolution-tunable double-crystal analyzer
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
5
国際会議録
First attempt of the medical application of the refraction-based computed tomography [6142-135]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |