Scanning microscopy with extended depth of focus

Scanning microscopy with extended depth of focus

著者名:

Juskaitis, R. ( Univ. of Oxford (United Kingdom) )
Botcherby, E.J. ( Univ. of Oxford (United Kingdom) )
Wilson, T. ( Univ. of Oxford (United Kingdom) )

掲載資料名:

Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5701

発行年:

2005

開始ページ:

85

終了ページ:

92

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819456755 [0819456756]

言語:

英語

請求記号:

P63600/5701

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014918
シリーズID:	PA00000029
会議名:	SPIE BiOS : Three-dimensional and multidimensional microscopy
回次:	2005 : 12th
会議開催地:	San Jose, CA, USA
会議開催年:	2005.01.25-2005.01.27

類似資料:

1 国際会議録 An optical technique for fast focusing applied to high-aperture microscopy E. Botcherby, R. Juskaitis, M. Booth, T. Wilson SPIE - The International Society of Optical Engineering	7 国際会議録 High resolution stereo microscopy [5860-11] Hayward, R., Juskaitis, R., Wilson, T. SPIE - The International Society of Optical Engineering
2 国際会議録 Aberration-free refocusing in high numerical aperture microscopy T. Wilson, E. Botcherby, R. Juskaitis, M. Booth SPIE - The International Society of Optical Engineering	8 国際会議録 Aberration free refocusing for high numerical aperture microscopy E. Botcherby, R. Juškaitis, M. Booth, T. Wilson Society of Photo-optical Instrumentation Engineers
3 国際会議録 Aspects of color confocal microscopy Juskaitis,R., Wilson,T. SPIE-The International Society for Optical Engineering	9 国際会議録 Aperture correlation approach to confocal microscopy Wilson,T., Juskaitis,R., Neil,M.A.A., Kozubek,M. SPIE-The International Society for Optical Engineering
4 国際会議録 Imaging modalities in confocal correlation microscopy Juskaitis,R., Neil,M.A.A., Wilson,T. SPIE - The International Society for Optical Engineering	10 国際会議録 Semiconductor laser confocal and interference microscopy Wilson,T., Juskaitis,R., Rea,N.P. SPIE-The International Society for Optical Engineering
5 国際会議録 Extinction coefficient in confocal polarization microscopy Juskaitis,R., Higdon,P., Wilson,T. SPIE-The International Society for Optical Engineering	11 国際会議録 Confocal microscopy using optical fiber imaging bundles Juskaitis,R., Wilson,T., Watson,T.F. SPIE-The International Society for Optical Engineering
6 国際会議録 Pupil function engineering for confocal microscopy Wilson, T., Massoumian, F., Juskaitis, R. SPIE-The International Society for Optical Engineering	12 国際会議録 Point spread functions with extended depth of focus Wilson, T., Neil, M.A.A., Massoumain, F. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12