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Gaussian beam deconvolution in optical coherence tomography

著者名:
  • Ralston, T.S. ( Beckman Institute/Univ. of Illinois at Urbana-Champaign (USA) and Univ. of Illinois at Urbana-Champaign (USA) )
  • Marks, D.L. ( Beckman Institute/Univ. of Illinois at Urbana-Champaign (USA) and Univ. of Illinois at Urbana-Champaign (USA) )
  • Kamalabadi, F. ( Univ. of Illinois at Urbana-Champaign (USA) )
  • Boppart, S.A. ( Beckman Institute/Univ. of Illinois at Urbana-Champaign (USA) and Univ. of Illinois at Urbana-Champaign (USA) )
掲載資料名:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5701
発行年:
2005
開始ページ:
1
終了ページ:
12
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819456755 [0819456756]
言語:
英語
請求記号:
P63600/5701
資料種別:
国際会議録

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