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LOG-filter-based inspection of cluster Mura and vertical-band Mura on liquid crystal displays

著者名:
Chen, H. -C. ( National Chiao Tung Univ. (Taiwan) )
Fang, L. -T. ( National Chiao Tung Univ. (Taiwan) )
Lee, L. ( Taiwan TFT-LCD Association (Taiwan) )
Wen, C. -H. ( Taiwan TFT-LCD Association (Taiwan) )
Cheng, S. -Y. ( Industrial Technology Research Institute (Taiwan) )
Wang, S. -J. ( National Chiao Tung Univ. (Taiwan) )
さらに 1 件
掲載資料名:
Machine Vision Applications in Industrial Inspection XIII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5679
発行年:
2005
開始ページ:
257
終了ページ:
265
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819456526 [0819456527]
言語:
英語
請求記号:
P63600/5679
資料種別:
国際会議録

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