An LOD with improved breakdown voltage in full-frame CCD devices

An LOD with improved breakdown voltage in full-frame CCD devices

著者名:

Banghart, E. K. ( Eastman Kodak Co. (USA) )
Stevens, E. G. ( Eastman Kodak Co. (USA) )
Doan, H. Q. ( Eastman Kodak Co. (USA) )
Shepherd, J. P. ( Eastman Kodak Co. (USA) )
Meisenzahl, E. J. ( Eastman Kodak Co. (USA) )

掲載資料名:

Digital photography : 17-18 January 2005, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5678

発行年:

2005

開始ページ:

34

終了ページ:

47

総ページ数:

14

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819456519 [0819456519]

言語:

英語

請求記号:

P63600/5678

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014895
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Digital photography
回次:	2005
会議開催地:	San Jose, CA, USA
会議開催年:	2005.01.17-2005.01.18

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