Blank Cover Image

Optical second harmonic generation microscopy under circularly polarized beam

著者名:
掲載資料名:
Nonlinear Optical Phenomena and Applications
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5646
発行年:
2004
開始ページ:
149
終了ページ:
155
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819456014 [0819456012]
言語:
英語
請求記号:
P63600/5646
資料種別:
国際会議録

類似資料:

Cox, G.C., Manconi, F., Kable, E.

SPIE-The International Society for Optical Engineering

C. Hu, T. Vu, G.-P. Li

Society of Photo-optical Instrumentation Engineers

Banavar, M., Kable, E. P. W., Braet, F., Wang, X. M., Gorrell, M. D., Cox, G.

SPIE - The International Society of Optical Engineering

Kao,F.-J., Wang,Y.-S., Huang,M.-K., Huang,S.-L., Cheng,P.

SPIE - The International Society for Optical Engineering

Xu, P., Wen, X., Zheng, Z., Kable, E., Cox, G., Zhu, H.

SPIE - The International Society of Optical Engineering

Cox, G.C., Feijo, J.

SPIE - The International Society of Optical Engineering

Xu Z., Fauchet M. P., Wicks W. G., Shaw J. M., Jaros M., Richman B., Rella C.

Kluwer Academic Publishers

P. T. Fwu, C. Chou, W. Chen, C. Dong

SPIE - The International Society of Optical Engineering

Cox, G.C., Xu, P., Sheppard, C.J.R., Ramshaw, J.A.

SPIE-The International Society for Optical Engineering

Reiser, K. M., Stoller, P., Celliers, P., Rubenchik, A., Bratton, C., Yankelevich, D.

SPIE-The International Society for Optical Engineering

M.-H. Chen, W.-L. Chen, Y. Sun, P. T. Fwu, M.-G. Lin, C.-Y. Dong

SPIE - The International Society of Optical Engineering

Mansfield, J. C., Winlove, C. P., Knapp, K., Matcher, S. J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12