Imaging quality analysis of KBA x-ray microscope working at grazing incidence

Imaging quality analysis of KBA x-ray microscope working at grazing incidence

著者名:

Hu, J. ( Dalian Univ. of Technology (China) )
Zhao, L. ( Dalian Univ. of Technology (China) )
Li, X. ( Dalian Univ. of Technology (China) )
Wu, X. ( Dalian Univ. of Technology (China) )
Bai, Y. ( Changchun Institute of Optics, Fine Mechanics and Physics, CAS (China) )

掲載資料名:

Optical design and testing II : 8-12 November 2004, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5638

発行年:

2004

開始ページ:

955

終了ページ:

960

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455932 [0819455938]

言語:

英語

請求記号:

P63600/5638-2

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014853
シリーズID:	PA00000029
会議名:	Photonics Asia : Optical design and testing
回次:	2004 : 2nd
会議開催地:	Beijing, China
会議開催年:	2004.11.08-2004.11.12

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