Research on modern testing technique of optical system resolution based on CCD imaging theory and DLP occurring figure device

Research on modern testing technique of optical system resolution based on CCD imaging theory and DLP occurring figure device

著者名:

Li, Z. ( Changchun Univ. of Science and Technology (China) )
Li, L. ( Changchun Univ. of Science and Technology (China) )
Zeng, C. ( Institute of Tracking and Telecommunication Technology (China) )
An, Z. ( Changchun Univ. of Science and Technology (China) )

掲載資料名:

Optical design and testing II : 8-12 November 2004, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5638

発行年:

2004

開始ページ:

777

終了ページ:

782

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455932 [0819455938]

言語:

英語

請求記号:

P63600/5638-2

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014853
シリーズID:	PA00000029
会議名:	Photonics Asia : Optical design and testing
回次:	2004 : 2nd
会議開催地:	Beijing, China
会議開催年:	2004.11.08-2004.11.12

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