Research on testing technique of image inclining and graduation inclining of optical system based on CCD imaging theory

Research on testing technique of image inclining and graduation inclining of optical system based on CCD imaging theory

著者名:

Cao, W. ( Changchun Univ. of Science and Technology (China) )
Yang, R. ( Changchun Univ. of Science and Technology (China) )
An, Z. ( Changchun Univ. of Science and Technology (China) )
Li, X. ( Changchun Univ. of Science and Technology (China) )

掲載資料名:

Optical design and testing II : 8-12 November 2004, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5638

発行年:

2004

開始ページ:

140

終了ページ:

145

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455932 [0819455938]

言語:

英語

請求記号:

P63600/5638-1

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014852
シリーズID:	PA00000029
会議名:	Photonics Asia : Optical design and testing
回次:	2004 : 2nd
会議開催地:	Beijing, China
会議開催年:	2004.11.08-2004.11.12

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