Influence of preparation technique on the microscopic structure and surface morphology of nanometer Ti02 thin films
- 著者名:
Hu, X. ( Northwest Univ. (China) ) Fan, J. ( Northwest Univ. (China) ) Li, T. ( Northwest Univ. (China) ) Zhang, D. ( Northwest Univ. (China) ) Bai, J. ( Northwest Univ. (China) ) Hou, X. ( Northwest Univ. (China) and Xi'an Institute of Optics and Precision Mechanics, CAS (China) ) - 掲載資料名:
- Nanophotonics, Nanostructure, and Nanometrology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5635
- 発行年:
- 2004
- 開始ページ:
- 390
- 終了ページ:
- 398
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455901 [0819455903]
- 言語:
- 英語
- 請求記号:
- P63600/5635
- 資料種別:
- 国際会議録
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1
国際会議録
Preparation of Si-based films by pulse laser deposition and luminescence properties [6149-97]
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Trans Tech Publications |
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SPIE - The International Society of Optical Engineering |