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Influence of preparation technique on the microscopic structure and surface morphology of nanometer Ti02 thin films

著者名:
Hu, X. ( Northwest Univ. (China) )
Fan, J. ( Northwest Univ. (China) )
Li, T. ( Northwest Univ. (China) )
Zhang, D. ( Northwest Univ. (China) )
Bai, J. ( Northwest Univ. (China) )
Hou, X. ( Northwest Univ. (China) and Xi'an Institute of Optics and Precision Mechanics, CAS (China) )
さらに 1 件
掲載資料名:
Nanophotonics, Nanostructure, and Nanometrology
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5635
発行年:
2004
開始ページ:
390
終了ページ:
398
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455901 [0819455903]
言語:
英語
請求記号:
P63600/5635
資料種別:
国際会議録

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