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Quality measurement of cutting and grinding surfaces based on image

著者名:
  • Liu, X. ( Harbin Univ. of Science and Technology (China) )
  • Wang, Y. ( Harbin Univ. of Science and Technology (China) )
  • Li, Y. ( Harbin Univ. of Science and Technology (China) )
  • Yan, F. ( Harbin Univ. of Science and Technology (China) )
  • Zhao, Y. ( Harbin Univ. of Science and Technology (China) )
掲載資料名:
Light-Emitting Diode Materials and Devices
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5632
発行年:
2004
開始ページ:
139
終了ページ:
146
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455871 [0819455873]
言語:
英語
請求記号:
P63600/5632
資料種別:
国際会議録

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