Evolution of laser damage in indium antimonide(InSb) at 1.06-μm wavelength
- 著者名:
- Garg, A. ( Univ. of Delhi (India) )
- Tripathi, K. N. ( Univ. of Delhi (India) )
- Kapoor, A. ( Univ. of Delhi (India) )
- Bansal, S. K. ( Univ. of Delhi (India) )
- 掲載資料名:
- Lasers in Material Processing and Manufacturing II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5629
- 発行年:
- 2004
- 開始ページ:
- 361
- 終了ページ:
- 368
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455840 [0819455849]
- 言語:
- 英語
- 請求記号:
- P63600/5629
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
国際会議録
Laser measuring interferometer with wavelength 1,06μm and 0,63μm for optical components testing
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |