An automatic inspection of SMT rectangular chips based on PCA algorithm.

An automatic inspection of SMT rectangular chips based on PCA algorithm.

著者名:

Koh, K. -C. ( Sunmoon Univ. (South Korea) )
Ko, K. W. ( Sunmoon Univ. (South Korea) )
Choi, B. -W. ( Sunmoon Univ. (South Korea) )
Kim, J. H. ( Seoul National Univ. of Technology (South Korea) )
Cho, H. ( Korea Advanced Institute of Science and Technology (South Korea) )

掲載資料名:

Machine Vision and its Optomechatronic Applications

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5603

発行年:

2004

開始ページ:

208

終了ページ:

214

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455567 [0819455563]

言語:

英語

請求記号:

P63600/5603

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014809
シリーズID:	PA00000029
会議名:	Optics East : Machine Vision and its Optomechatronic Applications
回次:	2004
会議開催地:	Philadelphia, PA, USA
会議開催年:	2004.10.26-2004.10.28

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