Development of automatic inspection of defect of compact camera module
- 著者名:
- Ko, K. W. ( Sunmoon Univ. (South Korea) )
- Lee, Y. J. ( Sunmoon Univ. (South Korea) )
- Choi, B. -W. ( Sunmoon Univ. (South Korea) )
- Koh, K. C. ( Sunmoon Univ. (South Korea) )
- Kim, J. H. ( Seoul National Univ. of Technology (South Korea) )
- 掲載資料名:
- Machine Vision and its Optomechatronic Applications
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5603
- 発行年:
- 2004
- 開始ページ:
- 191
- 終了ページ:
- 198
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455567 [0819455563]
- 言語:
- 英語
- 請求記号:
- P63600/5603
- 資料種別:
- 国際会議録
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3
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Comparative evaluation of mask production CAR development processes with stepwise defect inspection
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