Mask manufacturing mix-and-match in front-end wafer processing
- 著者名:
- Frangen, A. ( Infineon Technologies SC300 GmbH and Co. KG (Germany) )
- Jakob, R. ( Infineon Technologies SC300 GmbH and Co. KG (Germany) )
- Kubis, M. ( Infineon Technologies SC300 GmbH and Co. KG (Germany) )
- 掲載資料名:
- 24th Annual BACUS Symposium on Photomask Technology
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5567
- 発行年:
- 2004
- 開始ページ:
- 1067
- 終了ページ:
- 1075
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455130 [081945513X]
- 言語:
- 英語
- 請求記号:
- P63600/5567-2
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
国際会議録
Optical front-end design:a comparison between lossy matching and matched-feedback architectures
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |