Compact reconnaissance imaging spectrometer for Mars (CRISM): characterization results for instrument and focal plane subsystems
- 著者名:
Silverglate, P. R. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Heffernan, K. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Bedini, P. D. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Boldt, J. D. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Cavender, P. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Choo, T. H. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Darlington, E. H. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Donald, E. T. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Fasold, M. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Fort, D. E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Gurnee, R. S. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Hayes, A. T. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Hayes, J. R. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Hemler, J. B. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Humm, D. C. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Izenberg, N. R. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Lee, R. E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Lees, W. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Lohr, D. A. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Murchie, S. L. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Murphy, G. A. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Reiter, R. A. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Rossano, E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Seagrave, G. G. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Schaefer, E. D. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Strohbehn, K. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Taylor, H. W. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Thompson, P. L. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Tossman, B. E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Wilson IV, P. ( Johns Hopkins Univ. Applied Physics Lab. (USA) ) Robinson, M. S. ( Northwestern Univ. (USA) ) Green, R. ( Jet Propulsion Lab. and California Institute of Technology (USA) ) Mitchell, S. E. ( Univ. of Maryland/College Park (USA) ) - 掲載資料名:
- Infrared systems and photoelectronic technology : 2-3, 5 August 2004, Denver, Colorado, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5563
- 発行年:
- 2004
- 開始ページ:
- 98
- 終了ページ:
- 110
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455017 [0819455016]
- 言語:
- 英語
- 請求記号:
- P63600/5563
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
CRISM(Compact Reconnaissance Imaging Spectrometer for Mars) on MRO(Mars Reconnaissance Orbiter)
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
American Institute of Aeronautics and Astronautics |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
ESA Publications Division |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |