Blank Cover Image

The diffraction-limited wavefront produce and measurement of the semiconductor laser diode

著者名:
  • Liu, H. ( Shanghai institute of Optics and Fine Mechanics (China) )
  • Liu, L. ( Shanghai institute of Optics and Fine Mechanics (China) )
  • Hu, Y. ( Shanghai institute of Optics and Fine Mechanics (China) )
  • Luan, Z. ( Shanghai institute of Optics and Fine Mechanics (China) )
  • Wang, L. ( Shanghai institute of Optics and Fine Mechanics (China) )
掲載資料名:
Free-space laser communications IV : 2-4 August 2004, Denver, Colorado, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5550
発行年:
2004
開始ページ:
405
終了ページ:
410
総ページ数:
6
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454881 [0819454885]
言語:
英語
請求記号:
P63600/5550
資料種別:
国際会議録

類似資料:

1 国際会議録 Polarization phase-shifting double-shearing interferometer for the test of the diffraction-limited wavefront

L. Wang, L. Liu, Z. Luan, J. Sun, Y. Zhou

Society of Photo-optical Instrumentation Engineers
7 国際会議録 A prototype of intersatellite laser communications terminals [5892-17]

Liu, L., Zhu, X., HU, Y,, Luan, Z., Wang, L., Liu, D., Goo, R., Xie, L., Yuan, L.

SPIE - The International Society of Optical Engineering
2 国際会議録 A whole-field double-shearing interferometer for the measurement of diffraction-limit wavefront [5892-55]

Xu, R., Liu, H., Luan, Z., Liu, L.

SPIE - The International Society of Optical Engineering
8 国際会議録 Effect of polarization on photorefractive grating formulated with any light modulation in birefringent photofractive material [5911-47]

Wang, X., Liu, L., Yan. A., Luan, Z, Hu, Z

SPIE - The International Society of Optical Engineering
3 国際会議録 Analysis of the influence of diffractions adding aberrations on the transmitter’s divergence [5892-56]

Liu, H,, Xu, R., Luan, Z., Hu, Y., Liu, L.

SPIE - The International Society of Optical Engineering
9 国際会議録 Bragg-dffraction grating focusing-devise design based on periodically invberted domains in lithium niobate cyrstals [5911-49]

Hu, Z., Liu, L., Luan, Z, Zhou, Y., Wang, X.

SPIE - The International Society of Optical Engineering
4 国際会議録 Double-shearing interferometer for accurate test of laser wavefront

Luan, Z., Liu, L., Zu, J., Teng, S.

SPIE - The International Society of Optical Engineering
10 国際会議録 Influence of light intensity on crossed-beam photorefractive gratings in doubly doped LiNbO3 crystals [6314-42]

Wang, K., Liu, L., Yan, A., Luan, Z., Hu, Z.

SPIE - The International Society of Optical Engineering
5 国際会議録 The mechanical design of the large-optics double-shearing interferometer for the test of diffraction-limited wavefront

L. Wang, L. Liu, L. Zhu, J. Sun, Y. Zhou

Society of Photo-optical Instrumentation Engineers
11 国際会議録 The analysis and the enhancement of low diffraction efficiency in 90-degree holographic recording geometry [5011-42]

Zhou, Y., Liu, L., Luan, Z, Yan, A., Wang, L.

SPIE - The International Society of Optical Engineering
6 国際会議録 Method of circular aperture sampling for wavefront analysis

Zhang, M., Liu, L., Luan, Z., Wan, L., Wang, L.

SPIE - The International Society of Optical Engineering
12 国際会議録 Large-Optics white light interferometer for laser wave front test: apparatus and application

Z. Luan, L. Liu, L. Wang, D. Liu

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12