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Crystal growth, characterization, and testing of Cd0.9Zn0.1Te single crystals for radiation detectors

著者名:
Mandal, K.C. ( EIC Labs., Inc. (USA) )
Noblitt, C. ( EIC Labs., Inc. (USA) )
Choi, M. ( EIC Labs., Inc. (USA) )
Rauh, R.D. ( EIC Labs., Inc. (USA) )
Roy, U.N. ( Fisk Univ. (USA) )
Groza, M. ( Fisk Univ. (USA) )
Burger, A. ( Fisk Univ. (USA) )
Holcomb, D.E. ( Oak Ridge National Lab. (USA) )
Jellison, G.E. ( Oak Ridge National Lab. (USA) )
さらに 4 件
掲載資料名:
Hard X-Ray and Gamma-Ray Detector Physics VI
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5540
発行年:
2004
開始ページ:
186
終了ページ:
196
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454782 [0819454788]
言語:
英語
請求記号:
P63600/5540
資料種別:
国際会議録

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