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Quantitative boundary reconstruction from truncated phase-contrast tomographic projections (Invited Paper)

著者名:
  • Shi, D. ( Illinois Institute of Technology (USA) )
  • Anastasio, M.A. ( Illinois Institute of Technology (USA) )
  • Pan, X. ( Univ. of Chicago (USA) )
掲載資料名:
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5535
発行年:
2004
開始ページ:
310
終了ページ:
317
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454737 [0819454737]
言語:
英語
請求記号:
P63600/5535
資料種別:
国際会議録

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