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Two-point diffraction interferometer for absolute distance measurement

著者名:
  • Kim, S.-W. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Rhee, H.-G. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Joo, J.-Y. ( Korea Advanced Institute of Science and Technology (South Korea) )
  • Kim, Y.-J. ( Korea Advanced Institute of Science and Technology (South Korea) )
掲載資料名:
Interferometry XII: Techniques and Analysis
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5531
発行年:
2004
開始ページ:
162
終了ページ:
169
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454690 [0819454699]
言語:
英語
請求記号:
P63600/5531
資料種別:
国際会議録

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