Blank Cover Image

High-density multilayer recording of microgratings for optical data storage

著者名:
Orlic, S. ( Technische Univ. Berlin (Germany) )
Dietz, E. ( Technische Univ. Berlin (Germany) )
Frohmann, S. ( Technische Univ. Berlin (Germany) )
Mueller, C. ( Technische Univ. Berlin (Germany) )
Schoen, R. ( Technische Univ. Berlin (Germany) )
Trefzer, M. ( Technische Univ. Berlin (Germany) )
Eichler, H. J. ( Technische Univ. Berlin (Germany) )
さらに 2 件
掲載資料名:
Organic Holographic Materials and Applications II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5521
発行年:
2004
開始ページ:
161
終了ページ:
173
総ページ数:
13
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454591 [0819454591]
言語:
英語
請求記号:
P63600/5521
資料種別:
国際会議録

類似資料:

Orlic,S., Mueller,C., Schoen,R., Trefzer,M., Eichler,H.J.

SPIE-The International Society for Optical Engineering

Liang, Z., Ding, D., Xie, H., Gu, M., Chen, J., Zhuang, S.

SPIE - The International Society of Optical Engineering

Eichler, H.J., Kuemmel, P., Orlic, S., Wappelt, A.

SPIE

Eichler,H.J., Diez,S., Elschner,R., Macdonald,R., Schulz,R., Wappelt,A.G.

SPIE-The International Society for Optical Engineering

Eichler,H.J., Orlic,S., Kuemmel,P., Schupp,B.

SPIE - The International Society for Optical Engineering

C. Mueller, H. Markoetter, A. Schloesser, S. Orlic

Society of Photo-optical Instrumentation Engineers

Wappelt,A.G., Findeisen,J., Kuemmel,P., Orlic,S., Schulz,R., Eichler,H.J.

SPIE-The International Society for Optical Engineering

Criante, L., Beev, K., Lucchetta, D. E., Simoni, F., Frohmann, S., Orlic, S.

SPIE - The International Society of Optical Engineering

T. Feid, S. Frohmann, J. Rass, C. Müller, S. Orlic

Society of Photo-optical Instrumentation Engineers

R. Castagna, L. Criante, F. Vita, D. E. Lucchetta, S. Frohmann

Society of Photo-optical Instrumentation Engineers

Wang, W.J., Hong, M.H., Wu, D.J., Goh, Y.W., Luk'yanchuk, B.S., Chong, T.C.

SPIE-The International Society for Optical Engineering

Eichler, H.J., Kuemmel, P., Orlic, S., Schupp, B., Wappelt, A.

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12