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Advanced technology trends for astronomy at Rockwell Scientific

著者名:
Wong, S. S. ( Rockwell Scientific Co. (USA) )
Loose, M. ( Rockwell Scientific Co. (USA) )
Piquette, E. C. ( Rockwell Scientific Co. (USA) )
Garnett, J. D. ( Rockwell Scientific Co. (USA) )
Zandian, M. ( Rockwell Scientific Co. (USA) )
Farris, M. C. ( Rockwell Scientific Co. (USA) )
さらに 1 件
掲載資料名:
Optical and infrared detectors for astronomy : 21-22 June 2004, Glasgow, Scotland, United Kingdom
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5499
発行年:
2004
開始ページ:
258
終了ページ:
268
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454317 [0819454311]
言語:
英語
請求記号:
P63600/5499
資料種別:
国際会議録

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