Characterization and modeling of low-frequency noise in sub-0.1 -pm SiGe pMOSFETs
- 著者名:
- Romanjek, K. ( IMEP-CNRS (France) )
- Chroboczek, J. A. ( CEA-LETI (France) )
- Ghibaudo, G. ( IMEP-CNRS (France) )
- Ernst, T. ( CEA-LETI (France) )
- 掲載資料名:
- Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5470
- 発行年:
- 2004
- 開始ページ:
- 496
- 終了ページ:
- 506
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453969 [081945396X]
- 言語:
- 英語
- 請求記号:
- P63600/5470
- 資料種別:
- 国際会議録
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9
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