Thermal de-embedding procedure for cryogenic on-wafer high-frequency noise measurement
- 著者名:
Delcourt, S. ( Institut d'Electronique de Microelectronique et de Nanotechnologie (France) ) Dambrine, G. ( Institut d'Electronique de Microelectronique et de Nanotechnologie (France) ) Bourzgui, N. E. ( Institut d'Electronique de Microelectronique et de Nanotechnologie (France) ) Danneville, F. ( Institut d'Electronique de Microelectronique et de Nanotechnologie (France) ) Laporte, C. ( Ctr. National d'Etudes Spatiales (France) ) Fraysse, J.-P. ( Alcatel Space (France) ) Maignan, M. ( Alcatel Space (France) ) - 掲載資料名:
- Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5470
- 発行年:
- 2004
- 開始ページ:
- 414
- 終了ページ:
- 421
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453969 [081945396X]
- 言語:
- 英語
- 請求記号:
- P63600/5470
- 資料種別:
- 国際会議録
類似資料:
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Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs (Invited Paper)
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