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Accuracy assessment of compact RF noise models for SiGe HBTS by hydrodynamic device simulation (Invited Paper)

著者名:
  • Jungemann, C. ( Technische Univ. Carolo-Wilhelmina zu Braunschweig (Germany) )
  • Neinhus, B. ( Technische Univ. Carolo-Wilhelmina zu Braunschweig (Germany) )
  • Meinerzhagen, B. ( Technische Univ. Carolo-Wilhelmina zu Braunschweig (Germany) )
  • Dutton, R. W. ( Stanford Univ. (USA) )
掲載資料名:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5470
発行年:
2004
開始ページ:
173
終了ページ:
184
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453969 [081945396X]
言語:
英語
請求記号:
P63600/5470
資料種別:
国際会議録

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