Noise investigations of 90-nm VLSi CMOS technologies for analog integrated circuits at millimeter-wave frequencies

Noise investigations of 90-nm VLSi CMOS technologies for analog integrated circuits at millimeter-wave frequencies

著者名:

Ellinger, F. ( Swiss Federal Institute of Technology Zurich (Switzerland) and IBM/ETH Ctr. for Advanced Silicon Electronics (Switzerland) )
Schmatz, M. L. ( IBM Zurich Research Lab. (Switzerland) )
Jackel, H. ( Swiss Federal Institute of Technology Zurich (Switzerland) and IBM/ETH Ctr. for Advanced Silicon Electronics (Switzerland) )

掲載資料名:

Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5470

発行年:

2004

開始ページ:

131

終了ページ:

140

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453969 [081945396X]

言語:

英語

請求記号:

P63600/5470

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014661
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Noise In Devices and Circuits
回次:	2004 : 2nd
会議開催地:	Maspalomas, Gran Canaria, Spain
会議開催年:	2004.05.26-2004.05.28

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