Characterization and modeling of high-frequency noise in MOSFETs for RF IC design (Invited Paper)
- 著者名:
- Chen, C.-H. ( McMaster Univ. (Canada) )
- Asgaran, S. ( McMaster Univ. (Canada) )
- Li, F. ( McMaster Univ. (Canada) )
- Deen, M. J. ( McMaster Univ. (Canada) )
- 掲載資料名:
- Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5470
- 発行年:
- 2004
- 開始ページ:
- 49
- 終了ページ:
- 60
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453969 [081945396X]
- 言語:
- 英語
- 請求記号:
- P63600/5470
- 資料種別:
- 国際会議録
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