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Resistance noise scaling in a two-dimensional hole system in GaAs (Invited Paper)

著者名:
Leturcq, R. ( CEA Saclay (France) )
Deville, G. ( CEA Saclay (France) )
L'Hote, D. ( CEA Saclay (France) )
Tourbot, R. ( CEA Saclay (France) )
Mellor, C. J. ( Univ. of Nottingham (United Kingdom) )
Henini, M. ( Univ. of Nottingham (United Kingdom) )
さらに 1 件
掲載資料名:
Fluctuations and noise in materials : 26-28 May, 2004, Maspalomas, Gran Canaria, Spain
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5469
発行年:
2004
開始ページ:
101
終了ページ:
113
総ページ数:
13
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453921 [0819453927]
言語:
英語
請求記号:
P63600/5469
資料種別:
国際会議録

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