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A 3D scanning device for architectural survey based on time-of-flight technology

著者名:
Fontana, R. ( Istituto Nazionale di Ottica Applicata (Italy) )
Gambino, M. C. ( Istituto Nazionale di Ottica Applicata (Italy) )
Gianfrate, G. ( Univ. degli Studi di Lecce (Italy) )
Greco, M. ( Istituto Nazionale di Ottica Applicata (Italy) )
Pampaloni, E. ( Istituto Nazionale di Ottica Applicata (Italy) )
Pezzati, L. ( Istituto Nazionale di Ottica Applicata (Italy) )
さらに 1 件
掲載資料名:
Optical Metrology in Production Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5457
発行年:
2004
開始ページ:
393
終了ページ:
400
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453792 [081945379X]
言語:
英語
請求記号:
P63600/5457
資料種別:
国際会議録

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