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Pseudo-phase information of complex analytic signal of speck]e fields and its applications: microdisplacement measurement based on phase-only correlation in signal domain

著者名:
  • Wang, W. ( Univ. of Electro-Communications (Japan) )
  • Ishii, N. ( Univ. of Electro-Communications (Japan) )
  • Miyamoto, Y. ( Univ. of Electro-Communications (Japan) )
  • Takeda, M. ( Univ. of Electro-Communications (Japan) )
掲載資料名:
Optical Metrology in Production Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5457
発行年:
2004
開始ページ:
44
終了ページ:
49
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453792 [081945379X]
言語:
英語
請求記号:
P63600/5457
資料種別:
国際会議録

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