Single-sided x-ray inspection of vehicles using AS&E's Z-Backscatter Van

Single-sided x-ray inspection of vehicles using AS&E's Z-Backscatter Van

著者名:: Chalmers, A. ( American Science and Engineering, Inc. (USA) )
掲載資料名:: Penetrating Radiation Systems and Applications V
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 5199
発行年:: 2003
開始ページ:: 19
終了ページ:: 25
総ページ数:: 7
出版情報:: Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819450722 [0819450723]
言語:: 英語
請求記号:: P63600/5199
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00014636
シリーズID:	PA00000029
会議名:	Optics & Photonics : Penetrating Radiation Systems and Applications
回次:	2003 : 5th
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.06-2003.08.08

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