CTI distribution within a damaged CCD pixel having a notch structure

CTI distribution within a damaged CCD pixel having a notch structure

著者名:

Tsunemi, H. ( Osaka Univ. (Japan) )
Miki, M. ( Osaka Univ. (Japan) )
Miyata, E. ( Osaka Univ. (Japan) )
Hiraga, J. ( The Institute of Space and Astronautical Science (Japan) )
Miyaguchi, K. ( Hamamatsu Photonics K.K. (Japan) )

掲載資料名:

Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5198

発行年:

2004

開始ページ:

111

終了ページ:

118

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450715 [0819450715]

言語:

英語

請求記号:

P63600/5198

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014635
シリーズID:	PA00000029
会議名:	Optics & Photonics : Hard X-Ray and Gamma-Ray Detector Physics
回次:	2003 : 5th
会議開催地:	San Diego, CA, USA
会議開催年:	2003.08.04-2003.08.05

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