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New progress in large-size CZT single-crystal growth for nuclear radiation detectors (Invited Paper)

著者名:
Li, L. ( Yinnel Tech, Inc. (USA) )
Lu, F. ( Yinnel Tech, Inc. (USA) )
Lee, C. ( Yinnel Tech, Inc. (USA) )
Yao, H. W. ( Advanced Micro Devices, Inc. (USA) )
Burger, A. ( Fisk Univ. (USA) )
Groza, M. ( Fisk Univ. (USA) )
Wright, G. W. ( Fisk Univ. (USA) )
James, R. B. ( Brookhaven National Lab. (USA) )
Olsen, R. W. ( Consultant (USA) )
Luke, P. N. ( Lawrence Berkeley National Lab. (USA) )
Shah, K. S. ( Radiation Monitoring Devices, Inc. (USA) )
Cirignano, L. J. ( Radiation Monitoring Devices, Inc. (USA) )
Squillante, M. R. ( Radiation Monitoring Devices, Inc. (USA) )
Ouimette, D. R. ( Multidimensional Imaging, Inc. (USA) )
さらに 9 件
掲載資料名:
Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5198
発行年:
2004
開始ページ:
41
終了ページ:
47
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450715 [0819450715]
言語:
英語
請求記号:
P63600/5198
資料種別:
国際会議録

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