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Evaluation of CZT detectors with capacitive Frisch grid structure

著者名:
Cirignano, L. J. ( Radiation Monitoring Devices, Inc. (USA) )
Kim, H. ( Radiation Monitoring Devices, Inc. (USA) )
Shah, K. ( Radiation Monitoring Devices, Inc. (USA) )
Klugerman, M. ( Radiation Monitoring Devices, Inc. (USA) )
Wong, P. ( Radiation Monitoring Devices, Inc. (USA) )
Squillante, M. ( Radiation Monitoring Devices, Inc. (USA) )
Li, L. ( Yinnel Tech. Inc. (USA) )
さらに 2 件
掲載資料名:
Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5198
発行年:
2004
開始ページ:
1
終了ページ:
8
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450715 [0819450715]
言語:
英語
請求記号:
P63600/5198
資料種別:
国際会議録

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