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Subpicosecond streak camera measurements at LLNL: from IR to x-rays

著者名:
Kuba, J. ( Lawrence Livermore National Lab. (USA) )
Shepherd, R. ( Lawrence Livermore National Lab. (USA) )
Booth, R. ( Lawrence Livermore National Lab. (USA) )
Stewart, R. E. ( Lawrence Livermore National Lab. (USA) )
Lee, E. C. W. ( Lawrence Livermore National Lab. (USA) )
Audebert, P. ( Lawrence Livermore National Lab. (USA) )
Crane, J. K. ( Lawrence Livermore National Lab. (USA) )
Cross, R. R. ( Lawrence Livermore National Lab. (USA) )
Dunn, J. ( Lawrence Livermore National Lab. (USA) )
Springer, P. T. ( Lawrence Livermore National Lab. (USA) )
さらに 5 件
掲載資料名:
Fourth-generation X-ray sources and ultrafast X-ray detectors :4 and 6 August 2003, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5194
発行年:
2004
開始ページ:
183
終了ページ:
192
総ページ数:
10
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450678 [0819450677]
言語:
英語
請求記号:
P63600/5194
資料種別:
国際会議録

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