Subpicosecond streak camera measurements at LLNL: from IR to x-rays
- 著者名:
Kuba, J. ( Lawrence Livermore National Lab. (USA) ) Shepherd, R. ( Lawrence Livermore National Lab. (USA) ) Booth, R. ( Lawrence Livermore National Lab. (USA) ) Stewart, R. E. ( Lawrence Livermore National Lab. (USA) ) Lee, E. C. W. ( Lawrence Livermore National Lab. (USA) ) Audebert, P. ( Lawrence Livermore National Lab. (USA) ) Crane, J. K. ( Lawrence Livermore National Lab. (USA) ) Cross, R. R. ( Lawrence Livermore National Lab. (USA) ) Dunn, J. ( Lawrence Livermore National Lab. (USA) ) Springer, P. T. ( Lawrence Livermore National Lab. (USA) ) - 掲載資料名:
- Fourth-generation X-ray sources and ultrafast X-ray detectors :4 and 6 August 2003, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5194
- 発行年:
- 2004
- 開始ページ:
- 183
- 終了ページ:
- 192
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450678 [0819450677]
- 言語:
- 英語
- 請求記号:
- P63600/5194
- 資料種別:
- 国際会議録
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SPIE-The International Society for Optical Engineering |
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SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |