Beam splitting and recombining of the radiation from an EUV free-electron laser by means of reflection gratings
- 著者名:
- Poletto, L. ( Univ. degli Studi di Padova, INFM (Italy) )
- Azzolin, P. ( Univ. degli Studi di Padova, INFM (Italy) )
- Tondello, G. ( Univ. degli Studi di Padova, INFM (Italy) )
- Naletto, G. ( Univ. degli Studi di Padova, INFM (Italy) )
- 掲載資料名:
- Fourth-generation X-ray sources and ultrafast X-ray detectors :4 and 6 August 2003, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5194
- 発行年:
- 2004
- 開始ページ:
- 95
- 終了ページ:
- 104
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450678 [0819450677]
- 言語:
- 英語
- 請求記号:
- P63600/5194
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
High-resolution monochromators for the utilization of the radiation from an EUV free-electron laser
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
国際会議録
Stigmatic EUV spectroscopic system for emission and absorption studies of laser-produced plasmas
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
ESA Publications Division |
12
国際会議録
Grazing incidence flat-field spectrometer with spatial resolution capability for extended sources
SPIE-The International Society for Optical Engineering |