Approaches to etch-resistant 193-nm photoresists: performance and prospects
- 著者名:
Allen, R. D. ( IBM Almaden Research Ctr. ) Opitz, J. ( IBM Almaden Research Ctr. ) Ito, H. ( IBM Almaden Research Ctr. ) Wallow, T. I. ( IBM Almaden Research Ctr. ) Casmier, D. V. ( IBM Almaden Research Ctr. ) DiPietro, R. A. ( IBM Almaden Research Ctr. ) Brock, P. J. ( IBM Almaden Research Ctr. ) Breyta, G. ( IBM Almaden Research Ctr. ) Sooriyakumaran, R. ( IBM Almaden Research Ctr. ) Larson, C. E. ( IBM Almaden Research Ctr. ) Hofer, D. C. ( IBM Almaden Research Ctr. ) Varanasi, P. R. ( IBM Microelectronics Div. ) Mewherter, A. M. ( IBM Microelectronics Div. ) Jayaraman, S. ( IBM Microelectronics Div. ) Vicari, R. ( IBM Microelectronics Div. ) Rhodes, L. F. ( IBM Microelectronics Div. ) Sun, S. ( IBM Microelectronics Div. ) - 掲載資料名:
- Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3678
- 発行年:
- 1999
- 開始ページ:
- 66
- 終了ページ:
- 77
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819431523 [0819431524]
- 言語:
- 英語
- 請求記号:
- P63600/3678-1
- 資料種別:
- 国際会議録
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