A Statistical Analysis Of Laser Ablated BSTO/LAO Films For Microwave Applications

A Statistical Analysis Of Laser Ablated BSTO/LAO Films For Microwave Applications

著者名:

Romanofsky, R.R.

掲載資料名:

Materials issues for tunable RF and microwave devices III : symposium held April 2-3, 2002, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

720

発行年:

2002

開始ページ:

111

終了ページ:

122

総ページ数:

12

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996564 [1558996567]

言語:

英語

請求記号:

M23500/720

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014593
シリーズID:	PA00000011
会議名:	Symposium on materials issues for tunable rf and microwave devices
回次:	3rd
会議開催地:	San Francisco, CA, USA
会議開催年:	2002.04.02-2002.04.03

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