High Throughput X-ray Diffractometer for Combinatorial Epitaxial Thin Films
- 著者名:
Ohtani, M. Fukumura, T. Ohtomo, A. Kikuchi, T. Omote, K. Koinuma, H. Kawasaki, M. - 掲載資料名:
- Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 700
- 発行年:
- 2002
- 開始ページ:
- 125
- 終了ページ:
- 132
- 総ページ数:
- 8
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996366 [1558996362]
- 言語:
- 英語
- 請求記号:
- M23500/700
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
Materials Research Society |
Materials Research Society |
12
国際会議録
Ultraviolet Excitonic Laser Action at Room Temperature in ZnO Nanocrystalline Epitaxial Films
Trans Tech Publications |