Growth and Characterization of Ge Nanostructures on Si(111)
- 著者名:
- 掲載資料名:
- Current issues in heteroepitaxial growth--stress relaxation and self assembly : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 696
- 発行年:
- 2002
- 開始ページ:
- 175
- 終了ページ:
- 180
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996328 [155899632X]
- 言語:
- 英語
- 請求記号:
- M23500/696
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Trans Tech Publications |
Materials Research Society |
Materials Research Society |
3
国際会議録
Ge/Si island nucleation and ordering on naturally and artificially patterned substrates [6036-65]
SPIE - The International Society of Optical Engineering |
Elsevier |
Materials Research Society |
10
国際会議録
Growth and Characterization of Single-Crystal Multilayer Nanostructures for Fast Ion Conduction
American Chemical Society |
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
12
国際会議録
Investigating photonic nanostructures for reproducible characterization of bacterial spores
SPIE - The International Society of Optical Engineering |