Helical-Type Surface Defects in GaN and InGaN Thin Films Epitaxially Grown on GaN Templates at Reduced Temperatures

Helical-Type Surface Defects in GaN and InGaN Thin Films Epitaxially Grown on GaN Templates at Reduced Temperatures

著者名:

Miraglia, Peter

Liliental-Weber, Zuzzana

さらに 2 件

掲載資料名:

GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

693

発行年:

2002

開始ページ:

565

終了ページ:

570

総ページ数:

6

出版情報:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996298 [155899629X]

言語:

英語

請求記号:

M23500/693

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014569
シリーズID:	PA00000011
会議名:	Symposium on gan and related alloys
回次:	2001
会議開催地:	Boston, MA, USA
会議開催年:	2001.11.26-2001.11.30

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2 国際会議録 Removal of 6H-SiC Substrate Influence When Evaluating GaN Thin Film Properties via X-ray Preble, Edward A., Miraglia, Peter Q., Roskowski, Amy M., Einfeldt, Sven, Davis, Robert F. Materials Research Society	8 国際会議録 TEM/HREM Analysis of Defects in GaN Epitaxial Layers Grown by MOVPE on SiC and Sapphire Ruvimov, S., Liliental-Weber, Z., Dieker, C., Washburn, J., Koike, M., Amano, H., Akasaki, I. MRS - Materials Research Society
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