Blank Cover Image

Analysis of Alternating Current Conduction and Impedance Spectroscopy Study of BaBi2Nb2O9 Thin Films

著者名:
掲載資料名:
Ferroelectric Thin Films X : symposium held November 25-29, 2001, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
688
発行年:
2002
開始ページ:
241
終了ページ:
246
総ページ数:
6
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996243 [1558996249]
言語:
英語
請求記号:
M23500/688
資料種別:
国際会議録

類似資料:

Laha, Apurba, Krupanidhi, S. B., Saha, S.

Materials Research Society

Victor, P., Bhattacharyya, S., Saha, S., Krupanidhi, S. B.

Materials Research Society

Laha, Apurba, Saha, S., Krupanidhi, S.B.

Materials Research Society

Victor, P., Saha, S., Krupanidhi, S. B.

Materials Research Society

Laha, Apurba, Saha, S., Krupanidhi, S. B.

Materials Research Society

Das, R.R., Perez, W., Rodriguez, R.J., Dobal, P.S., Katiyar, R.S., Krupanidhi, S.B.

Materials Research Society

Laha, A., Krupanidhi, S.B.

SPIE - The International Society of Optical Engineering

Venkateswarlu, P., Krupanidhi, S.B.

SPIE-The International Society for Optical Engineering

Krupanidhi, S.B., Laha, A.

SPIE - The International Society of Optical Engineering

Bhaskar, S., Majumder, S.B., Dobal, P.S., Krupanidhi, S.B., Katiyar, R.S.

Materials Research Society

Victor, P., Bhattacharyya, S., Saha, S., Krupanidhi, S. B.

Materials Research Society

Rajasekarakumar, V., Victor, P., Saha, R. Ranjith S., Rajagopalan, S., Tyagi, A. K., Krupanidhi, S. B.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12