Investigations of Buried Interfaces Using High Energy X-ray Reflectivity

Investigations of Buried Interfaces Using High Energy X-ray Reflectivity

著者名:

Rieutord, F.

掲載資料名:

Application of synchrotron radiation techniques to materials science VI : symposium held April 16-20, 2001, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

678

発行年:

2001

総ページ数:

5

出版情報:

Warrendale, Penn.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996144 [1558996141]

言語:

英語

請求記号:

M23500/678

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00014561
シリーズID:	PA00000011
会議名:	Symposium on application of synchrotron radiation techniques to materials science
回次:	6th
会議開催地:	San Francisco, CA, USA
会議開催年:	2001.04.16-2001.04.20

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